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HomeNanotechnologyAccessible Strategy to Measure Layer Quantity in 2D Supplies

Accessible Strategy to Measure Layer Quantity in 2D Supplies

Optical distinction is a well-liked preliminary method for figuring out the layer numbers in two-dimensional supplies. Nonetheless, it’s not often employed as a affirmation method.

Universal, Easily Accessible Approach to Measure Layer Number in 2D Materials​​​​​​​

​​​​​​​Research: Optical Microscope Based mostly Common Parameter for Figuring out Layer Quantity in Two-Dimensional Supplies. Picture Credit score: RomanenkoAlexey/

A major disparity in optical distinction throughout completely different imaging methods exists, necessitating a system-independent evaluation of optical contrasts. A latest research printed within the journal ACS Nano addresses this problem by presenting a common method for quantifying the layer numbers in two-dimensional supplies using crimson−inexperienced−blue (RGB) and RAW optical pictures.

Two-Dimensional Supplies: Overview and Significance

Two-dimensional supplies are made up of 1 or only a few atomic layers of drugs which have fascinating optoelectronic traits. Two-dimensional supplies have discovered a number of functions in sensing and quantum computing because of their distinctive options like excessive surface-to-volume ratio, floor cost, kind, excessive diploma of anisotropy, and tunable chemical exercise.

Because the discovery of graphene, two-dimensional supplies have attracted outstanding scientific curiosity. Their distinct optical, electrical, and mechanical qualities supply appreciable promise as essential elements in revolutionary electronics and optoelectronics functions.

The atomic thickness and uncovered massive floor space of two-dimensional supplies make them extraordinarily designable and manipulable, leading to a variety of business functions.

Fabrication Strategies of Two-Dimensional Supplies

Numerous approaches could also be used to fabricate two-dimensional supplies. Whereas these processes differ significantly, they could be categorized as both top-down procedures, through which the two-dimensional supplies are extracted from a bulk supply, or bottom-up methods, through which the two-dimensional supplies are produced to the suitable specs.

Mechanical exfoliation, a top-down method, is essentially the most prevalent methodology for producing high-quality flakes of two-dimensional supplies. Nonetheless, exfoliation creates irregularly dispersed flakes with completely different layer numbers over the substrates, requiring a easy mechanism for figuring out layer numbers.

Identification of Layer Quantity in Two-Dimensional Supplies

Numerous approaches, similar to Raman spectrometry, photoluminescence (PL), atomic drive microscopy (AFM), or optical distinction, are used to find out the layer quantity. Setups for Raman spectrometry, AFM, or PL want specialised gear and particular methods. In consequence, typical layer identification methods are gradual and enhance the price of the operation, significantly for multilayered samples.

The optical distinction method, then again, requires only a primary optical microscope imaging equipment, making it very environment friendly and low cost. Many earlier research have used optical microscope pictures to establish layer numbers in two-dimensional supplies.

Variations within the energy of the substrates and the flake depth of two-dimensional supplies for separate crimson, inexperienced, and blue channels could also be used to tell apart numerous layered areas. Till now, optical distinction has been employed solely for quick identification relatively than definitive verification of layer numbers.

Highlights and Key Developments of the Present Research

This analysis aimed to discover a easy and common criterion for measuring layer quantity in two-dimensional supplies. Utilizing a number of imaging gadgets, the researchers examined bodily exfoliated molybdenum disulfide (MoS2) particles in RGB and RAW codecs.

A Fresnel-reflectance-based scanning mannequin was employed to compute and validate the noticed depth ratio. Furthermore, the researchers developed a MATLAB-based graphical consumer interface (GUI) that may rapidly decide layer numbers in two-dimensional supplies.

For RGB pictures, the slope of flake depth versus substrate depth is derived from optical photos with growing gentle energy. The depth slope specifies the layer numbers and is unbiased of the imaging system used.

In RAW pictures, depth slopes and ratios are unbiased of the system and brightness. Thus, the depth slope (for RGB) and the depth ratio (for RAW) are common traits for figuring out layer numbers. Though the RAW format isn’t supported by all imaging methods, it will possibly verify layer numbers utilizing a single optical picture, making it a fast and system-independent generic method.

Future Outlook

The slope method and GUI established on this work don’t want particular gear, making them appropriate to be used in any lab outfitted with an optical microscope. Based mostly on these discoveries, it’s cheap to count on that this method could also be utilized to any two-dimensional materials. A repository of slope and ratio values for numerous two-dimensional supplies on numerous substrates might be constructed for fast identification of layer numbers.

This method can be predicted to hurry up the dedication of layer numbers and decrease heterostructure manufacturing time, making two-dimensional supplies best to be used in numerous industrial functions.


Mondal, M. et al. (2022). Optical Microscope Based mostly Common Parameter for Figuring out Layer Quantity in Two-Dimensional Supplies. ACS Nano. Out there at:

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